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Joint Test Action Group
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#	Item
581	Application Note 210 Running FreeRTOS on the Keil MCBSTM32 Board with the RVMDK Evaluation Tools Document number: ARM DAI 0210A Issued: June, 2008 Add to Reading List Source URL: infocenter.arm.com Language: English Microcontrollers Embedded operating systems Real-time operating systems ARM architecture Embedded microprocessors FreeRTOS STM32 Joint Test Action Group KEIL Computer architecture Electronics Computing
582	NXP Mini ARM7/LFPAK motion-control development kit Quick, cost-effective development of brushed/brushless DC motor controllers Add to Reading List Source URL: www.nxp.com Language: English - Date: 2015-02-12 09:31:50 Technology Brushless DC electric motor Motor controller DC motor Brushed DC electric motor MOSFET Joint Test Action Group ARM7 Microcontroller Electric motors Electrical engineering Electromagnetism
583	Actel SmartFusion and Keil Add to Reading List Source URL: arm.com Language: English - Date: 2013-04-22 16:59:33 Electronics manufacturing Embedded systems IEEE standards ARM architecture Integrated circuits Joint Test Action Group Segger Microcontroller Systems Boundary scan Debug port Electronics Electronic engineering Computer architecture
584	i.MX31and i.MX31L Multimedia Applications Processors Add to Reading List Source URL: www.freescale.com Language: English - Date: 2009-10-23 18:29:28 Electronics I.MX ARM11 Freescale Semiconductor Joint Test Action Group Tegra SIMD ATI Technologies Computer architecture ARM architecture Computing
585	8/16-bit XMEGA A1 Microcontroller ATxmega128A1 / ATxmega64A1 Not recommended for new designs - Preliminary Add to Reading List Source URL: www.atmel.com Language: English - Date: 2014-10-13 09:34:07 Electronic engineering Central processing unit Embedded systems Instruction set architectures Atmel AVR Norwegian Institute of Technology Joint Test Action Group CPU design Instruction set Computer architecture Microcontrollers Computer hardware
586	Datasheet TetraMAX ATPG Automatic Test Pattern Generation Overview Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-02-18 14:15:52 Integrated circuits Automatic test pattern generation Electronics manufacturing Electronic design Test compression Scan chain Iddq testing Joint Test Action Group Synopsys Electronic engineering Electronics Electronic design automation
587	Gertbot Advanced Rev[removed]Oct[removed]Gertbot Advanced Rev-3.2, 27-Oct.-2014 Add to Reading List Source URL: www.gertbot.com Language: English - Date: 2014-11-14 05:02:57 Stepper motor Joint Test Action Group Electromagnetism Motor controller Manufacturing Electric motors Electrical engineering Electronics manufacturing
588	Published by ROVERS EXCEED EXPECTATIONS • REDEFINING HARDWARE IN REAL TIME • CATCHING UP WITH CLOCKS ➜ ➜ Add to Reading List Source URL: journal-download.co.uk Language: English - Date: 2014-11-18 06:23:47 Internet of Things Constrained Application Protocol Embedded system Operating system Field-programmable gate array Software Linux Cloud computing Joint Test Action Group Computing Electronics Ambient intelligence
589	usmbcadpcomqueanhaasheets32F103xC_E5401.svg Add to Reading List Source URL: www.espruino.com Language: English - Date: 2014-01-08 10:23:09 Computing Embedded systems Microcontrollers Central processing unit Flash memory CompactFlash Universal Serial Bus Serial Peripheral Interface Bus Joint Test Action Group Computer hardware Computer memory Electronics
590	Document No.: FT_000173 FT2232D DUAL USB TO SERIAL UART/FIFO IC Datasheet Version 2.05 Clearance No.: FTDI# 127 Future Technology Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:25:24 Microcontrollers Universal asynchronous receiver/transmitter Universal Serial Bus RS-232 USB flash drive Joint Test Action Group Serial Peripheral Interface Bus Serial port FTDI Computer hardware Electronics Computing

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